Multi Frequency Method of Fault Diagnosis Technique in Ana log Circuit to Avoid Ambiguity Set in Integer Coded Dictionary

R N S Kalpana¹

¹Assistant Professor, Department of ECE, TKR Engineering College Hyderabad, India

Abstract

An efficient method to select an optimum set of test points for dictionary techniques in analog fault diagnosis is proposed. This is done by searching for the minimum of the entropy index based on the available test points. First, the two–dimensional integer–coded dictionary is constructed whose entries are measurements associated with faults and test points. The problem of optimum test point's selection is, thus, transformed to the selection of the columns that isolate the rows of the dictionary. Then, the likelihood for a column to be chosen based on the size of its ambiguity set is evaluated using the minimum entropy index of test points. Finally, the test point with the minimum entropy index is selected to construct the optimum set of test points. The comparison between the proposed method and other reported test points selection methods is carried out by statistical experiments. The main objective of this project is to show that he proposed method more efficiently and more accurately finds the locally optimum set of test points and is practical for multiple faults in large scale analog systems.

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Cite this Article as Follows

R N S Kalpana. "Multi Frequency Method of Fault Diagnosis Technique in Ana log Circuit to Avoid Ambiguity Set in Integer Coded Dictionary" International Conference on Systems, Science, Control, Communication, Engineering and Technology (2017): 25. Print.