Abstract
The GaALAs SB quaternary alloys are important materials covering the wavelengths betweeen the visible and infrared region (0.57, 1.72 um) suitable for device application, such as injection lasers, photodiodes, and solar cells [1.2]. In this paper we present how to determine the build in voltage Vd and the intercept voltage Vint and also the net doping concentration Nd in the Ga0.60Al0.40As0.034Sb0.96 layer from capacitance voltage measurements at different temperature (220,540,260 k), using the "intercept method". And finally we report on the determination of the conduction and valance band offsets Ec and Ev in a GaSB (p=2.1018) / Ga0.60Al0.40As0.03Sb0.96(n).