ICIEMS 2015

International Conference on Information Engineering, Management and Security 2015

 


ICIEMS 2015 Kokula Krishna Hari K
Publication Meta Value
Short Title ICIEMS 2015
Publisher ASDF, India
ISBN 13 978-81-929742-7-9
ISBN 10 81-929742-7-8
Language English
Type Hard Bound - Printed Book
Copyrights ICIEMS Organizers / DCRC, London, UK
Editor-in-Chief Kokula Krishna Hari K
Conference Dates 13 - 14, August 2015
Venue Country IITM-RP, Chennai, India
Submitted Papers 410
Acceptance Rate 4.11%
Website www.iciems.in

Paper 042


Microphysical Parameters Analysis of Cloud using X & Ka band Dual Polarized Doppler Weather Radar

Microphysical Parameters Analysis of Cloud using X & Ka band Dual Polarized Doppler Weather Radar

Anurag Tirthgirikar1, Milind Patil1, Kaustav Chakravarty2

1Deptment. of Electronics and Telecommunication, Vishwakarma Institute of Information Technology, Pune, India., 2Physical Meteorology and Aerosol Division, Indian Institute of Tropical Meteorology, Pashan, Pune, India.

Abstract

The study of microphysical parameter of clouds is studied and analyzed using X & Ka band Dual Polarized Doppler Weather Radar. Field work is done on operational characteristics of both the radars stationed at Mandhardevi and is used to analyze cloud pattern behavior over Mahabaleshwar region during monsoon period. X band radar is used for analysis of precipitation characteristics of cloud for convective and stratiform rainfall pattern. Ka band radar is used for study and analysis of cloud dynamics which include cloud height behavior during a rain event over Mahabaleshwar region. Disdrometer is used to measure the drop size distribution for convective and stratiform rain events over Mahabaleshwar.

Author's Profile

Anurag Tirthgirikar : Profile

Milind Patil : Profile

Kaustav Chakravarty : Profile

Cite this Article as Follows

Anurag Tirthgirikar, Milind Patil, Kaustav Chakravarty. "Microphysical Parameters Analysis of Cloud using X & Ka band Dual Polarized Doppler Weather Radar." International Conference on Information Engineering, Management and Security (2015): 251-254. Print.